School of Physics, Engineering and Technology
- School of Physics, Engineering and Technology
- Research and innovation
- Communication technologies
- Projects
- Electromagnetic Monitoring of Semiconductor Ageing
Electromagnetic Monitoring of Semiconductor Ageing
PIC Test Board
Monitoring emissions from PIC board using onboard coupler
Shift in the emission spectrum of PIC due to ageing‌
IGBT Dual pulse test system
Change in waveform with ageing
The ability to monitor the through life ageing of semiconductor devices is useful to provide system health level information. Here we aim to determine the feasibility of methods of monitoring age related performance effects which require no connection to the circuit and no additional circuitry in the design. This may be achieved by monitoring the electromagnetic emissions of the circuit, or its non-linear interaction with an applied electromagnetic field.
We tested a number of simple systems to determine whether ageing effects can be observed in integrated circuits, and power devices. In order to ensure consistent and repeatable measurements RF couplers have been incorporated into the design of the test boards.
Currently we are assessing the effects of ageing on IGBT switching devices EMC and performance.
Members
Links
- York Research Database: EPSRC (Publications, Related Projects, etc.)
- York Research Database: UoM (Publications, Related Projects, etc.)
Funding
- EPSRC EP/1033246/1 Project SC15
- University of Malta (PhD Studentship)
Research