Acquired in 2018, the FEI Nova 200 is a focused ion beam scanning electron microscope (FIBSEM) or DualBeam™ instrument. It is used for cutting & milling with the gallium ion beam using ion sputtering. The (Sirion™) electron column is equipped with a Schottky (field-assisted) thermionic emitter and operates between 2 and 30 keV; the liquid metal (gallium) ion source operates between 5 and 30 keV and sits in a (Magnum™) ion column with octupole electrostatic lens.
This instrument is equipped with:
The instrument is used for TEM lamella preparation and manufacturing near-nanometre sized holes for plasmonic devices.
Please contact the Director (Dr Steve Tear) or the Experimental Officer (Dr Jonathan Barnard) for further details about access. You can also email firstname.lastname@example.org.
Step-by-step procedure for TEM lamella preparation. The identification and extraction of magnetic devices for examination in the TEM (see JEOL 2010 for bright-field image). Extraction and milling is about 5 to 6 hours per sample.
An array of holes on Au-SiN membranes cut for electron interferometry experiments. Each slot is 500 nm wide.
Mounting a lamella onto an OmniProbe™ grid (left) with the Kleindiek micro-manipulator.