Accessibility statement

Atomic Force Microscopy

Available modes:

Contact, tapping, ScanAsyst Air and Fluid, Peak Force, conductive and magnetic force microscopy 

AFM Specifications

  • X-Y Scan Range ≥100 μm, open-loop or closed-loop operation
  • Z Scan Range ≥15 μm, open-loop or closed-loop operation
  • Deflection Detection IR superluminescent diode (SLD) λ=850 nm
  • Baseline Tilt <0.25 nm/μm
  • XY Sensor Noise <150 pm
  • Height Noise 35 pm (typical with appropriate vibration and acoustic isolation)
  • XY Sample Stage Motorized stage with 10 mm x 10 mm range

Accessories:

  • Perfusion Stage Incubator 
  • Sample Heating
  • Top-View Optics 
  • Nanomechanics Package

Bruker BioScope AFM