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Electron Microscopy EMAG (IOP) International Conference

Posted on 10 September 2013

The Electron Microscopy EMAG (IOP) international Conference held in the Exhibition Centre last week was greatly enjoyed by the participants. including Professor Archie Howie, pioneer of electron microscopy, who was behind the concept of the of the York JEOL Nanocentre along with the Vice Chancellor

The Electron Microscopy EMAG (IOP) international Conference held in the Exhibition Centre last week was greatly enjoyed by the participants.  Although proposed in 2008 the Conference finally arrived in York this year!  Professor Archie Howie, pioneer of electron microscopy and who was behind the concept of the of the York JEOL Nanocentre along with the VC, has supported and encouraged the Nanocentre efforts.  He was particularly impressed with the quality of the research carried out in the Nanocentre having attended many of the presentations and posters.  (EPSRC Materials staff were also present for some of the sessions).  The Howie Symposium celebrating Archie’s pioneering electron microscopy brought together some of Archie’s former students (Marks, Krivanek, Craven and Pratibha Gai), and his former postdoc (Ed Boyes). 

Electron Microscopy and Analysis Group web site