Dr Steve Tear, BSc (Warwick), DPhil (York), CPhys, MInstP, FRMS

Contact details

Mail:
Department of Physics
University of York
Heslington
York
YO10 5DD
U.K.
Tel:
+44 (0)1904 322202
Fax:
+44 (0)1904 322214
E-mail:
steve.tear@york.ac.uk
Room:
P/C007
Site:
http://www-users.york.ac.uk/~spt1/

Research Group

  • Dr Andrew Pratt
  • Dr Chris Eames
  • Mr Charles Woffinden
  • Mr Michael Reakes
  • Mr Andrew Vick (joint with Dr Thompson)
  • Mr Jeremy Mitchell (Joint with Prof. Yuan)

Recent Publications

C EAMES, MIJ PROBERT AND SP TEAR
Quantitative LEED I-V and ab initio study of the Si(111)-3x2-Sm surface structure and the missing half-order spots in the 3x1 diffraction pattern
Phys. Rev. B 75 205420 (2007) (9 pages)

A PRATT, JAD MATTHEW, M EL-GOMATI AND SP TEAR
Quantitative interpretation of the low-loss electron signal
Surf. Sci. 601 1804-1812 (2007) (9 pages)

C. BONET AND S. P. TEAR.
Self-assembly of ultrafine nanolines upon ho reaction with the ge(001) surface.
Appl. Phys. Lett. 89(20), 203119, (2006).

C. EAMES, C. BONET, M. I. J. PROBERT, S. P. TEAR, AND E. W. PERKINS.
Stm and ab initio study of holmium nanowires on a ge(111) surface.
Phys. Rev. B 74(19), 193318, (2006).

T. J. WOOD, C. BONET, T. C. Q. NOAKES, P. BAILEY, AND S. P. TEAR.
Medium-energy ion scattering investigation of the surface and subsurface structure of three-dimensional hosi2-x grown on si(111).
Phys. Rev. B 73(23), 235405, (2006).

M EL-GOMATI, F ZAGGOUT, H JAYACODY, S TEAR AND K WILSON
Why is it possible to detect doped regions of semiconductors in low voltage SEM: a review and update
Surf. Interface Anal. 37 901-911 (2005) (11 pages)

C. BONET, T. J. WOOD, S. P. TEAR, and others (7).
Trends and strain in the structures of two-dimensional rare-earth silicides studied using medium-energy ion scattering.
Phys. Rev. B 72, 165407 (2005). [ external link ]

H. MENARD, A. B. HORN, AND S. P. TEAR.
Methylsilane on Cu(111), a STM study of the (root 3X root 3)R30 degrees-Cu2Si surface silicide.
Surface Science 585, 47-52 (2005).

M. A. MUNOZ-MARQUEZ, T. J. WOOD, S. P. TEAR, and others (11).
Energy loss in medium-energy ion scattering, A combined theoretical and experimental study of the model system Y on Si(111).
Phys. Rev. B 72, 075415 (2005). [ external link ]

E. W. PERKINS, C. BONET, AND S. P. TEAR.
Silicon overlayer growth on clean and hydrogen-terminated two-dimensional holmium silicide.
Phys. Rev. B 72, 195406 (2005). [ external link ]

E. W. PERKINS, I. M. SCOTT, AND S. P. TEAR.
Growth and electronic structure of holmium silicides by STM and STS.
Surface Science 578, 80-87 (2005).

T. J. WOOD, C. BONET, T. C. Q. NOAKES, P. BAILEY, AND S. P. TEAR.
A medium-energy ion scattering investigation of the structure and surface vibrations of two-dimensional YSi2 grown on Si(111).
Surface Science 598, 120-127 (2005).

C. BONET, D. J. SPENCE, AND S. P. TEAR.
Structural study of 2D dysprosium germanide and silicide by means of quantitative LEED I-V analysis.
Surface Science 504, 183-190 (2002).

D. J. SPENCE, T. C. Q. NOAKES, P. BAILEY, AND S. P. TEAR.
Structural studies of two- and three-dimensional dysprosium silicides using medium-energy ion scattering.
Surface Science 512, 61-66 (2002).

P. BAILEY, T. C. Q. NOAKES, C. J. BADDELEY, S. P. TEAR, AND D. P. WOODRUFF.
Monolayer resolution in medium energy ion scattering.
Nuclear Instruments & Methods Phys. Research Section B-Beam Interactions Materials Atoms 183, 62-72 (2001).

H. KITAYAMA, S. P. TEAR, D. J. SPENCE, AND T. URANO.
Structure analysis of two-dimensional Holmium silicide by low energy electron diffraction.
Surface Science 482, 1481-1486 (2001).

D. J. SPENCE, T. C. Q. NOAKES, P. BAILEY, AND S. P. TEAR.
Investigation of a two-dimensional dysprosium germanide on Ge(111), A medium-energy ion-scattering study including direct observation of a reversal of top-layer buckling upon adsorption of hydrogen (vol B 62, pg 5016 (2000).
Phys. Rev. B 63, art. no.-049901 (2001). [external link]

Patents

JF GREGG, SM THOMPSON AND SP TEAR
Dual Tip Spin Polarised Scanning Tunnelling Microscope
PCT/GB2007/ 003780 (05 October 2007)
 

Steve Tear

Summary of expertise

  • Surface and interface structure of metal-semiconductors
  • Low-Energy Electron Diffraction
  • Scanning Tunnelling Microscopy
  • Medium-Energy Ion Scattering