Profile

Career

BSc (Leeds), MSc (Surrey), PhD (Cambridge), FRMS

University Roles

• Professor of Electron Microscopy
• Co Director, The York JEOL Nanocentre
  

Recent Highlights

• Invited Lecture on Microscopy in heritage studies of medieval buildings at environmental risk, International Microscopy Congress (IMC17, 2010), Brazil.
• European Microscopy Congress (EMC) 2012-programme committee
• Royal Microscopical Society UK Council

Publications

Over 200 refereed scientific papers and co-authored books and journal issues including, Electron Microscopy in Heterogeneous Catalysis (IOPP) and Microscopy and Microanalysis (Cambridge UP). Click the publications tab above for details.

Summary of expertise

• Nanostructural Studies
• Aberration Corrected High Resolution Electron Microscopy
• Low voltage, high resolution SEM developments
• Dynamic studies
  

Research

Overview

Research Group: Nanophysics

Publications

Selected publications

From the work carried out at the York JEOL Nanocentre

2011

ED BOYES
Microscopy in the heritage studies of medieval buildings (with reference to York Minster)
Proc.of Electron Microscopy (IMC 17; 2 pages).

PL GAI AND ED BOYES
Atomic resolution-Environmental TEM and applications,
Handbook on Nanoscopy (Eds: G Van Tendeloo, D Van Dyke and SJ Pennycook) (2011:  in press); (20 pages).

K YOSHIDA, M MAKIHARA, N TANAKA, S AOYAGI, E NISHIBORI, M SAKATA, ED BOYES AND P L GAI
Three-dimensional Nanostructure and Specific Surface Area Measurements of Porous Titania Photocatalysts by Electron Tomography and Their Relation to
Photocatalytic Activity
Microscopy and Microanalysis, 2011 (12 pages).

NR SHIJU, K YOSHIDA,ED BOYES,DR BROWN AND PL GAI
In-situ atomic scale electron microscopy in the development of pharmaceutical
NSAIDS (Paracetamol):
Catalysis Science and Technology (Royal Soc. Chem.), 2011 ( 14 pages: in press).

JH GARRIDO, K YOSHIDA, C CHRISTENSEN, ED BOYES, P MIDGLEY AND PL GAI
The location of gold nanoparticles on titania: A study using aberration corrected electron microscopy and 3D tomography,
Catalysis Today, 160, 165 (2011) (5 pages)

2010

ED BOYES
Systematic zone axis analyses of nanoparticles,
Proc. Electron Microscopy, Rio de Janeiro, Brazil, 2010 (2 pages)

PL GAI AND ED BOYES
Angstrom Analysis with dynamic In-situ Aberration corrected electron microscopy,
Journal of Physics, EMAG conf ser 241, 012055, 2010 (6 pages).
 
ED BOYES, M WALSH, K YOSHIDA and PL GAI
Aberration corrected EM and applications,
AMTC2 Letters (2010) (2 pages)

PL GAI, K YOSHIDA, C SHUTE, M WALSH, M WARD, X JIA, JR WEERTMAN, MS DRESSELHAUS AND ED BOYES
Probing structures of nanomaterials using advanced electron microscopy methods including in-situ aberration corrected electron microscopy at the Angstrom scale
Microscopy Research and Technique 2010 (in press).

PL GAI AND ED BOYES
Development of In-situ aberration corrected electron microscopy,
International Conf on Adv Micros and Theory, Nagoya, Japan , AMTC2 Letters, 2010 (2 pages).

M. WARD, K YOSHIDA, ED BOYES AND PL GAI
Nanostructural studies of Nano-ZnO tetrapods,
IMC 17, Rio, Brazil (2010) (2 pages).

M. WALSH, K YOSHIDA, PL GAI AND ED BOYES
In-situ studies of gold nanoparticles,
Proc. IMC 17, Rio, Brazil (2010) (2 pages)

M. WALSH, K YOSHIDA, PL GAI AND ED BOYES
In-situ aberration corrected EM of supported nanoparticles,  J. Physics 2010 (4 pages)
 
PL GAI AND ED BOYES
Angstrom Analysis in Dynamic In-situ Aberration Corrected Electron Microscopy
Proc. IMC 17, Rio de Janeiro, Brazil (2010) (2 pages).

K YOSHIDA, NR SHIJU, ED BOYES,DR BROWN AND PL GAI
In-situ Aberration Corrected ElectronMicr Observation of Active Sites in Tungstated Zirconia Nanocatalysts for Pharmaceuticals,
IMC17, 2010 ( 2 pages)

2009 

ED BOYES  
Microanalysis at low voltages,
EMRS Conf. Proc., Gdnask, Poland, 2009 (4 pages).

PL GAI,  J MONTERO, A LEE, K WILSON AND ED BOYES
In-situ aberration-corrected transmission electron micr of MgO nanocatalysts for biodiesels,
Catal.Letters.132, 182, 2009. (7 pages)

K YOSHIDA, NR SHIJU, DR BROWN, PL GAI AND ED BOYES
In-situ Aberration corrected EM of tungstaed nano-zirconia,
Microscopy and microanalysis Conf.Proc.  2009 (2 pages).

PL GAI AND ED BOYES 
Novel In situ aberration corrected electron microscopy at 0.1 nm resolution :
Microscopy Research and Technique (Wiley), 72, 153, 2009 (11 pages).

M WALSH, K YOSHIDA, PL GAI AND ED BOYES
Proc. EMAG Conference, September 2009 (4 pages).

PL GAI, K YOSHIDA AND ED BOYES:  
In-situ aberration corrected EM,
Proc. FEMMs, Nagasaki, Japan, 2009 (2 pages).

PL GAI AND ED BOYES,
Proc. EMAG (IOP), In-situ aberration corrected EM September 2009 (6 pages)

K YOSHIDA, NR SHIJU, D BROWN, ED BOYES AND PL GAI
Proc. EMAG Conference, Sept 09.

K YOSHIDA, N TANAKA, ED BOYES AND PL GAI
Proc. EMAG Conference, September 2009 (4 pages).

K YOSHIDA, NR SHIJU, D BROWN, E D BOYES AND P L GAI
Microscopy Society of America, 2009 (2 pages).

External activities

Invited talks and conferences

• Frontiers in electron microscopy and materials science (FEMMS),  Nagasaki, Japan;
• Microanalysis meeting, Gdansk, Poland;
• Innovative materials Conference, Gyeong-Ju, South Korea;
• Department of Materials, University of Oxford;
• Indian Institute of Science, Bangalore;
• International Advanced Microscopy and Theory Conference, Nagoya, Japan; 
• European Microscopy Congress, Germany;
• Electron microscopy conference, University of Cadiz, Spain;
• Midlands Microanalysis conference on nanoparticles, thin films and surface analysis with SEM, Loughborough;
• Chair and Organiser of internaional symposia including SEM symposium at Microscience-2010, London and European Microscopy Congress.

Other Distinctions and Highlights

• ERDF/EU/Nanofactory award of postdoctoral fellowship
• UK-India Educational Research Initiative (UKIERI) award
• Development of novel ultra high resolution low voltage SEM
• Served on EPSRC discussion panels
• Industrial collaborations with leading industries of UK and USA/studentships
• Fellow of the Royal Microscopical Society
• Co-authored books and journal issues, including Electron Microscopy in heterogeneous catalysis (IOPP), Microscopy and Microanalysis (Cambridge University Press);